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1 article(s) from Elias, George

The role of the cantilever in Kelvin probe force microscopy measurements

George Elias,
Thilo Glatzel,
Ernst Meyer,
Alex Schwarzman,
Amir Boag and
Yossi Rosenwaks

Beilstein J. Nanotechnol. 2011, 2, 252–260, doi:10.3762/bjnano.2.29

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Figure 1: (a) Geometrical model of a tip, with cone length l, half-aperture angle θ₀, spherical apex radius R...

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Figure 2: One dimensional PSF calculated for two different probe–sample distances with and without the cantil...

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Figure 3: Left axis: Relative magnitude of the homogeneous force distribution on different fractions of the p...

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Figure 4: Line section (vertical line at inset figure) for KPFM simulation with different cantilever geometri...

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Figure 5: Line section of UHV KPFM (i) measurements [20], (ii) simulated, and (iii) theoretical potential distrib...

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Figure 6: Beam deflection influence on PSF. The dashed line represents the PSF of a deflected beam while the ...

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Figure 7: Second harmonic deflection relative to the cantilever at its rest position. The free edge deflectio...

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Figure 8: Second harmonic weighting influence on the PSF. Dashed lines: PSF calculated with the second harmon...

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Full Research Paper

Published 18 May 2011

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